期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
Test Technology Newsletter 20182018, vol.34, no.1
Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit DesignMasahiro Fujita; Virendra Singh; Toral Shah; Anzhela Matrosova20182018, vol.34, no.1
NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment ApproachYang Yu; Jie Liang; Zhiming Yang; Xiyuan Peng20182018, vol.34, no.1
Automation of Test Program Synthesis for Processor Post-silicon ValidationVasudevan Madampu Suryasarman; Santosh Biswas; Aryabartta Sahu20182018, vol.34, no.1
EditorialVishwani D. Agrawal20182018, vol.34, no.1
New Editor – 2018 20182018, vol.34, no.1
Exploring System Availability During Software-Based Self-Testing of Multi-core CPUsMichael A. Skitsas; Chrysostomos A. Nicopoulos; Maria K. Michael20182018, vol.34, no.1
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoCXiaozhi Du; Dongyang Luo; Kailun Shi; Chaohui He; Shuhuan Liu20182018, vol.34, no.1
Vulnerability Analysis of Adder Architectures Considering Design and Synthesis ConstraintsMostafa Salehi; Ali Azarpeyvand; Armin Hajaboutalebi Aboutalebi20182018, vol.34, no.1
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoCDavide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Giorgio Pollaccia; Marco Restifo; Federico Venini20182018, vol.34, no.1



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