期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
Test Technology Newsletter 20182018, vol.34, no.2
Handling Unknown with Blend of Scan and Scan CompressionPralhadrao V. Shantagiri; Rohit Kapur20182018, vol.34, no.2
EditorialVishwani D. Agrawal20182018, vol.34, no.2
Measurement of Nonlinear Dielectric Behaviour of Semiconductor Material Under Microwave Field in Dual-Mode Rectangular CavityYong Gao; En Li; Gaofeng Guo20182018, vol.34, no.2
The Fundamental Primitives with Fault-Tolerance in Quantum-Dot Cellular AutomataMengbo Sun; Hongjun Lv; Yongqiang Zhang; Guangjun Xie20182018, vol.34, no.2
Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer EnvironmentNaoki Terao; Toru Nakura; Masahiro Ishida; Rimon Ikeno; Takashi Kusaka; Tetsuya Iizuka; Kunihiro Asada20182018, vol.34, no.2
Detectability Challenges of Bridge Defects in FinFET Based Logic CellsFreddy Forero; Jean-Marc Galliere; Michel Renovell; Victor Champac20182018, vol.34, no.2
Application of Machine Learning Techniques in Post-Silicon Debugging and Bug LocalizationEman El Mandouh; Amr G. Wassal20182018, vol.34, no.2
Machine Learning for Hardware Security: Opportunities and RisksRana Elnaggar; Krishnendu Chakrabarty20182018, vol.34, no.2



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