期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志:理论与应用
收藏年代2000~2024



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2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
Test Technology Newsletter 20182018, vol.34, no.3
Digital Predistortion for Spectrum Compliance in the Internet of ThingsSiyuan Yan; Xiao Li; Changhong Jiang; Hui Li; Lingmei Wang; Fu Li20182018, vol.34, no.3
Reliability Testing of 3D-Printed Electromechanical Scanning DevicesB. Mert G?nülta?; Janset Sava?; Ramin Khayatzadeh; Sacid Aygün; Fehmi ?ivitci; Y. Da?han G?kdel; M. Berke Yelten; Onur Ferhano?lu20182018, vol.34, no.3
Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST ApplicationsHani Malloug; Manuel J. Barragan; Salvador Mir20182018, vol.34, no.3
Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated SignalPeter Sarson; Tomonori Yanagida; Kosuke Machida20182018, vol.34, no.3
Golden-Free Processor Hardware Trojan Detection Using Bit Power Consistency AnalysisYang Zhang; Houde Quan; Xiongwei Li; Kaiyan Chen20182018, vol.34, no.3
Gate Oxide Short Defect Model in FinFETsRoya Dibaj; Dhamin Al-Khalili; Maitham Shams20182018, vol.34, no.3
EditorialVishwani D. Agrawal20182018, vol.34, no.3
Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF TestingKe Huang; Manuel J. Barragan20182018, vol.34, no.3
A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test EquipmentPeter Sarson; Tomonori Yanagida; Shohei Shibuya; Kosuke Machida; Haruo Kobayashi20182018, vol.34, no.3
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