期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
EditorialAgrawal, Vishwani D.20182018, vol.34, no.5
An Efficient SAT-Based Test Generation Algorithm with GPU AcceleratorOsama, Muhammad; Gaber, Lamya; Hussein, Aziza I.; Mahmoud, Hanafy20182018, vol.34, no.5
Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power SystemZhang, Shigang; Wang, Long; Liu, Ying; Zhang, Xiaofei; Yang, Yongmin20182018, vol.34, no.5
Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMPChepelev, Vladimir; Parfenov, Yury; Radasky, William; Titov, Boris; Zdoukhov, Leonid; Li, Kejie; Chen, Yuhao; Kong, Xu; Xie, Yan-zhao20182018, vol.34, no.5
Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoTYu, Weize; Wen, Yiming; Koese, Selcuk; Chen, Jia20182018, vol.34, no.5
High Performance Modified Static Segment Approximate Multiplier based on Significance ProbabilityVasanthanayaki, C.; Jothin, R.20182018, vol.34, no.5
Analytical Low Frequency NBTI Compact Modeling with H-2 Locking and Electron Fast Capture and EmissionQing, J.; Zeng, Y.; Li, X. J.; Zhang, P. J.; Sun, Y. B.; Shi, Y. L.20182018, vol.34, no.5
Impact of Aging on the Reliability of Delay PUFsKarimi, Naghmeh; Danger, Jean-Luc; Guilley, Sylvain20182018, vol.34, no.5
Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash MemoriesLu, Shyue-Kung; Zhong, Shang-Xiu; Hashizume, Masaki20182018, vol.34, no.5



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