期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2018, vol.34, no.1 2018, vol.34, no.2 2018, vol.34, no.3 2018, vol.34, no.4 2018, vol.34, no.5 2018, vol.34, no.6

题名作者出版年年卷期
2017 JETTA-TTTC Best Paper Award 20182018, vol.34, no.6
Test Technology Newsletter 20182018, vol.34, no.6
Path Representation in Circuit Netlists Using Linear-Sized ZDDs with Optimal Variable OrderingStelios N. Neophytou; Maria K. Michael20182018, vol.34, no.6
Multiple Missing Cell Defect Modeling for QCA DevicesVaishali H. Dhare; Usha S. Mehta20182018, vol.34, no.6
Generation Methodology for Good-Enough Approximate Modules of ATMRAbdus Sami Hassan; Tooba Arifeen; Hossein Moradian; Jeong-A Lee20182018, vol.34, no.6
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft ErrorXiaozhi Du; Dongyang Luo; Chaohui He; Shuhuan Liu20182018, vol.34, no.6
Blind Calibration Method for Two-Channel Time-Interleaved Analog-to-Digital Converters Based on FFTXu Bai; Hui Hu; Wanjun Li; Fulu Liu20182018, vol.34, no.6
A Simplified Calibration Methodology for On-Chip CouplersWei Jiang; Guoan Wang20182018, vol.34, no.6
EditorialVishwani D. Agrawal20182018, vol.34, no.6
Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell LibraryPablo Ilha Vaz; Thiago Hanna Both; Fábio Fedrizzi Vidor; Raphael Martins Brum; Gilson Inácio Wirth20182018, vol.34, no.6
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