期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delayZhexi Yao; Lingchao Zhu; Tao Zhang; Jinbo Wang20202020, vol.36, no.1
New Editor – 2020 20202020, vol.36, no.1
Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated ComponentsRoya M. Ahari; Mahdi Karbasian; Seyed Mostafa Banitaba20202020, vol.36, no.1
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point ArchitecturesSoham Roy; Brandon Stiene; Spencer K. Millican; Vishwani D. Agrawal20202020, vol.36, no.1
Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded SystemsAlejandro Serrano-Cases; Felipe Restrepo-Calle; Sergio Cuenca-Asensi; Antonio Martínez-álvarez20202020, vol.36, no.1
Test Technology Newsletter February 2020 20202020, vol.36, no.1
EditorialVishwani D. Agrawal20202020, vol.36, no.1
2019 Reviewers 20202020, vol.36, no.1
Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space ExplorationAvishek Choudhury; Biplab K. Sikdar20202020, vol.36, no.1
On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic CircuitsB. Deveautour; A. Virazel; P. Girard; V. Gherman20202020, vol.36, no.1
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