期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAsGokalan, Akin; Tosun, Suleyman; Dal, Deniz20202020, vol.36, no.6
Identification of Logic Paths Influenced by Severe Coupling CapacitancesMeza-Ibarra, I. D.; Champac, V; Gomez-Fuentes, R.; Noriega, J. R.; Vera-Marquina, A.20202020, vol.36, no.6
Proton Beam Validation of a New Single Event Transient Mitigation TechniqueSmith, Farouk20202020, vol.36, no.6
Efficient Designs of Reversible Majority VotersKheirandish, Davar; Haghparast, Majid; Reshadi, Midia; Hosseinzadeh, Mehdi20202020, vol.36, no.6
A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal CircuitsSanyal, Sayandeep; Bhattacharya, Mayukh; Patra, Amit; Dasgupta, Pallab20202020, vol.36, no.6
Diagnosis and Compensation of Control Program, Sensor and Actuator Failures in Nonlinear Systems Using Hierarchical State Space ChecksMomtaz, Md Imran; Chatterjee, Abhijit20202020, vol.36, no.6
Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D ICZeng, Lizhen; Shang, Yuling; Tan, Weipeng; Li, Chunquan; Fan, Haihua20202020, vol.36, no.6
EditorialAgrawal, Vishwani D.20202020, vol.36, no.6
Low-Cost Error Detection in Deep Neural Network Accelerators with Linear Algorithmic ChecksumsOzen, Elbruz; Orailoglu, Alex20202020, vol.36, no.6



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