期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS CircuitsLiu, Baojun; Cai, Li; Liu, Xiaoqiang20202020, vol.36, no.4
Novel MEMS Piezoresistive Sensor with Hair-Pin Structure to Enhance Tensile and Compressive Sensitivity and Correct Non-LinearityJindal, Sumit Kumar; De, Ritobrita; Kumar, Ajay; Raghuwanshi, Sanjeev Kumar20202020, vol.36, no.4
Design of an Integrated System for On-line Test and Diagnosis of Rotary ActuatorsPiccoli, Leonardo B.; Henriques, Renato V. B.; Baled, Tiago R.20202020, vol.36, no.4
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor CircuitIshizaka, Mamoru; Shintani, Michihiro; Inoue, Michiko20202020, vol.36, no.4
Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring SystemsHuang, Q.; Jiang, J.; Deng, Y. Q.20202020, vol.36, no.4
New Method for Determining and Predicting Test Interconnect Pin Current Carrying CapacityGurevich, Eli; Deshmukh, Pranit20202020, vol.36, no.4
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient FaultsCai, Shuo; Wang, Weizheng; Liu, Peng; Yu, Fei; Yin, Lairong; Li, Bo; He, Binyong20202020, vol.36, no.4
Testable Architecture Design for Programmable Cellular Automata on FPGA Using Run-Time Dynamically Reconfigurable Look-Up TablesPalchaudhuri, Ayan; Dhar, Anindya Sundar20202020, vol.36, no.4
Low-Power Area-Efficient Fault Tolerant Adder in Current Mode Multi Valued Logic Using Berger CodesMohammadi, Shahram; Omidi, Reza; Lotfinejad, Mohammad20202020, vol.36, no.4
EditorialAgrawal, Vishwani D.20202020, vol.36, no.4
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