期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-SimulationYu, Dongzhe; Wang, Han; Xu, Jiangtao20202020, vol.36, no.3
LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image ProcessingGarg, Bharat; Patel, Sujit Kumar; Dutt, Sunil20202020, vol.36, no.3
High Performance Approximate Memories for Image Processing ApplicationsJothin, R.; Mohamed, M. Peer20202020, vol.36, no.3
A probability density estimation algorithm on multiwavelet for the high-resolution ADCMa, Min; Huang, Jing; Yang, Xiaolei; Tang, Lingfan20202020, vol.36, no.3
EditorialAgrawal, Vishwani D.20202020, vol.36, no.3
Aging-Resilient SRAM-based True Random Number Generator for Lightweight DevicesWang, Wendong; Guin, Ujjwal; Singh, Adit20202020, vol.36, no.3
An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristicDas, Debaprasad; Mitra, Sanjoy20202020, vol.36, no.3
Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic StylesVarada, Sushanth; Katpally, Swapnil; Thiruveedhi, Subha Sri Lakshmi20202020, vol.36, no.3
Stuck-At Fault Mitigation of Emerging Technologies Based Switching LatticesAnghel, Lorena; Bernasconi, Anna; Ciriani, Valentina; Frontini, Luca; Trucco, Gabriella; Vatajelu, Ioana20202020, vol.36, no.3
Time Complexity Comparison of Stopping at First Failure and Completely Running the TestYucesan, Ongun; Ozkil, Altan20202020, vol.36, no.3
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