期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle FilterRathnapriya, S.; Manikandan, V.20202020, vol.36, no.2
A Novel Approach of Data Content Zeroization Under Memory AttacksSrivastava, Ankush; Ghosh, Prokash20202020, vol.36, no.2
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive DefectsCopetti, T.; Balen, T. R.; Brum, E.; Aquistapace, C.; Bolzani Poehls, L.20202020, vol.36, no.2
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace ApplicationsShah, Ambika Prasad; Vishvakarma, Santosh Kumar; Huebner, Michael20202020, vol.36, no.2
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin FilmsGe, Jinqun; Xia, Tian; Wang, Guoan20202020, vol.36, no.2
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic BiochipsHuang, Xijun; Xu, Chuanpei; Zhang, Long20202020, vol.36, no.2
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF CircuitsEl Badawi, H.; Azais, Florence; Bernard, S.; Comte, M.; Kerzerho, V; Lefevre, F.20202020, vol.36, no.2
Speed-Up in Test Methods Using Probabilistic Merit IndicatorsFooladi, Mahtab; Kamran, Arezoo20202020, vol.36, no.2
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCsKaibartta, Tanusree; Biswas, G. P.; Das, Debesh Kumar20202020, vol.36, no.2
Automated Bug Resistant Test Intent with Register Header Database for Optimized VerificationSharma, Gaurav; Bhargava, Lava; Kumar, Vinod20202020, vol.36, no.2
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