期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS CircuitsLiu, Baojun; Cai, Li; Liu, Xiaoqiang20202020, vol.36, no.4
Novel MEMS Piezoresistive Sensor with Hair-Pin Structure to Enhance Tensile and Compressive Sensitivity and Correct Non-LinearityJindal, Sumit Kumar; De, Ritobrita; Kumar, Ajay; Raghuwanshi, Sanjeev Kumar20202020, vol.36, no.4
Design of an Integrated System for On-line Test and Diagnosis of Rotary ActuatorsPiccoli, Leonardo B.; Henriques, Renato V. B.; Baled, Tiago R.20202020, vol.36, no.4
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor CircuitIshizaka, Mamoru; Shintani, Michihiro; Inoue, Michiko20202020, vol.36, no.4
Evaluation of Ionizing Radiation Effects on Device Modules Used in Wireless-Based Monitoring SystemsHuang, Q.; Jiang, J.; Deng, Y. Q.20202020, vol.36, no.4
New Method for Determining and Predicting Test Interconnect Pin Current Carrying CapacityGurevich, Eli; Deshmukh, Pranit20202020, vol.36, no.4
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient FaultsCai, Shuo; Wang, Weizheng; Liu, Peng; Yu, Fei; Yin, Lairong; Li, Bo; He, Binyong20202020, vol.36, no.4
Testable Architecture Design for Programmable Cellular Automata on FPGA Using Run-Time Dynamically Reconfigurable Look-Up TablesPalchaudhuri, Ayan; Dhar, Anindya Sundar20202020, vol.36, no.4
Low-Power Area-Efficient Fault Tolerant Adder in Current Mode Multi Valued Logic Using Berger CodesMohammadi, Shahram; Omidi, Reza; Lotfinejad, Mohammad20202020, vol.36, no.4
EditorialAgrawal, Vishwani D.20202020, vol.36, no.4
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