期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
Formal Verification of ECCs for Memories Using ACL2Naseer, Mahum; Ahmad, Waqar; Hasan, Osman20202020, vol.36, no.5
Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic DevicesParfenov, Yury; Chepelev, Vladimir; Chen, Yu-hao; Xie, Yan-zhao20202020, vol.36, no.5
Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based MethodsArulmurugan, Azhaganantham; Murugesan, Govindasamy; Vivek, Balasubramaniam20202020, vol.36, no.5
Soft Computing Techniques Based CAD Approach for Power Supply Noise Reduction in System-on-ChipMitra, Partha; Sarkar, Angsuman20202020, vol.36, no.5
TRAP-GATE: A Probabilistic Approach to Enhance Hardware Trojan Detection and its Game Theoretic AnalysisManivannan, Sivappriya; Kuppusamy, Lakshmi; Babu, N. Sarat Chandra20202020, vol.36, no.5
Part I: Evaluation for Hardware Trojan Detection Based on Electromagnetic RadiationSu, Ting; Li, Shaoqing; Tang, Yongkang; Chen, Jihua20202020, vol.36, no.5
Design Development and Testing of High Performance Microwave Frequency Up-ConverterKumar, Vipin20202020, vol.36, no.5
A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase RelationshipDjordjevic, Srdjan; Pesic, Miroljub T.20202020, vol.36, no.5
Tipping Point Analysis of Electrical Resistance Data with Early Warning Signals of Failure for Predictive MaintenanceLivina, Valerie N.; Lewis, Adam P.; Wickham, Martin20202020, vol.36, no.5
EditorialAgrawal, Vishwani D.20202020, vol.36, no.5



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