期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2018 2019 2020 2021 2022 2023
2024

2020, vol.36, no.1 2020, vol.36, no.2 2020, vol.36, no.3 2020, vol.36, no.4 2020, vol.36, no.5 2020, vol.36, no.6

题名作者出版年年卷期
Library Characterization of Arithmetic Circuits for Reliability-Aware Designs in SRAM-Based FPGAsGokalan, Akin; Tosun, Suleyman; Dal, Deniz20202020, vol.36, no.6
Identification of Logic Paths Influenced by Severe Coupling CapacitancesMeza-Ibarra, I. D.; Champac, V; Gomez-Fuentes, R.; Noriega, J. R.; Vera-Marquina, A.20202020, vol.36, no.6
Proton Beam Validation of a New Single Event Transient Mitigation TechniqueSmith, Farouk20202020, vol.36, no.6
Efficient Designs of Reversible Majority VotersKheirandish, Davar; Haghparast, Majid; Reshadi, Midia; Hosseinzadeh, Mehdi20202020, vol.36, no.6
A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal CircuitsSanyal, Sayandeep; Bhattacharya, Mayukh; Patra, Amit; Dasgupta, Pallab20202020, vol.36, no.6
Diagnosis and Compensation of Control Program, Sensor and Actuator Failures in Nonlinear Systems Using Hierarchical State Space ChecksMomtaz, Md Imran; Chatterjee, Abhijit20202020, vol.36, no.6
Detection and Diagnosis of Multi-Fault for through Silicon Vias in 3D ICZeng, Lizhen; Shang, Yuling; Tan, Weipeng; Li, Chunquan; Fan, Haihua20202020, vol.36, no.6
EditorialAgrawal, Vishwani D.20202020, vol.36, no.6
Low-Cost Error Detection in Deep Neural Network Accelerators with Linear Algorithmic ChecksumsOzen, Elbruz; Orailoglu, Alex20202020, vol.36, no.6



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