期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



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2024

2022, vol.38, no.1 2022, vol.38, no.2 2022, vol.38, no.3 2022, vol.38, no.4 2022, vol.38, no.5 2022, vol.38, no.6

题名作者出版年年卷期
Test Technology Newsletter 20222022, vol.38, no.6
Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security ApplicationsNaveenkumar R.; Sivamangai N. M.; Napolean A.; Priya S. Sridevi Sathya20222022, vol.38, no.6
A Complete Design-for-Test Scheme for Reconfigurable Scan NetworksLylina Natalia; Wang Chih-Hao; Wunderlich Hans-Joachim20222022, vol.38, no.6
EditorialAgrawal Vishwani D.20222022, vol.38, no.6
Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM CircuitPrakash Neelam Rup; Kaur Jasbir; Pannu Neha20222022, vol.38, no.6
Smell Detection Agent Optimization Approach to Path Generation in Automated Software TestingChandra S. S. Vinod; Sankar S. Saju; Anand H. S.20222022, vol.38, no.6
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site TestingFarayola Praise O.; Bruce Isaac; Chaganti Shravan K.; Sheikh Abalhassan; Ravi Srivaths; Chen Degang20222022, vol.38, no.6
A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection SystemsSharma G.?K.; Pattanaik Manisha; Sharma Richa20222022, vol.38, no.6
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing CountriesNguimfack-Ndongmo Jean de Dieu; Kentsa Zana Kevin; Asoh Derek Ajesam; Kengnou Telem Nicole Adéla?de; Kuate-Fochie René; Kenné Godpromesse20222022, vol.38, no.6
Using both Stable and Unstable SRAM Bits for the Physical Unclonable FunctionLai Zhi-Wei; Huang Po-Hua; Lee Kuen-Jong20222022, vol.38, no.5
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