期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

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2018 2019 2020 2021 2022 2023

2022, vol.38, no.1 2022, vol.38, no.2 2022, vol.38, no.3 2022, vol.38, no.4 2022, vol.38, no.5 2022, vol.38, no.6

题名作者出版年年卷期
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony AlgorithmArasteh Bahman; Imanzadeh Parisa; Arasteh Keyvan; Gharehchopogh Farhad Soleimanian; Zarei Bagher20222022, vol.38, no.3
A Systematic Bit Selection Method for Robust SRAM PUFsWang Wendong; Singh Adit D.; Guin Ujjwal20222022, vol.38, no.3
The Detection of Malicious Modifications in the FPGAZahid Kamran20222022, vol.38, no.3
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage ParallelismSparkman Brett; Smith Scott C.; Di Jia20222022, vol.38, no.3
EditorialAgrawal Vishwani D.20222022, vol.38, no.3
Deep Soft Error Propagation Modeling Using Graph Attention NetworkMa Junchi; Duan Zongtao; Tang Lei20222022, vol.38, no.3
Test Technology Newsletter 20222022, vol.38, no.3
Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoostXiao Yindong; Zeng Yutong; Wu Qiong; Liu Ke; Li Yanjun; Hu Chong20222022, vol.38, no.3
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFsKroeger Trevor; Cheng Wei; Danger Jean-Luc; Guilley Sylvain; Karimi Naghmeh20222022, vol.38, no.3



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