期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2022, vol.38, no.1 2022, vol.38, no.2 2022, vol.38, no.3 2022, vol.38, no.4 2022, vol.38, no.5 2022, vol.38, no.6

题名作者出版年年卷期
A Low-cost BIST Design Supporting Offline and Online TestsMenbari Ahmad; Jahanirad Hadi20222022, vol.38, no.1
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch DesignHu Guangzhen; Wang Jianan; Wang Hao; Yao Liang; Liang Huaguo; Yi Maoxiang; Huang Zhengfeng; Lu Yingchun20222022, vol.38, no.1
Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision DiagramsBu Dengli; Yan Junjie; Tang Pengjie; Yuan Haohao20222022, vol.38, no.1
Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold OperationBhattacharjee Abhishek; Nag Abhishek; Das Kaushik; Pradhan Sambhu Nath20222022, vol.38, no.1
A New Neural Network Based on CNN for EMIS IdentificationXiao Ying-chun; Zhu Feng; Zhuang Sheng-xian; Yang Yang20222022, vol.38, no.1
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling FrequenciesZhao Yujie; Katoh Kentaroh; Kuwana Anna; Katayama Shogo; Wei Jianglin; Kobayashi Haruo; Nakatani Takayuki; Hatayama Kazumi; Sato Keno; Ishida Takashi; Okamoto Toshiyuki; Ichikawa Tamotsu20222022, vol.38, no.1
2021 Reviewers 20222022, vol.38, no.1
Hardware Obfuscation for IP Protection of DSP ApplicationsR Naveenkumar; Sivamangai N.M.; A Napolean; Nissi G. Akashraj20222022, vol.38, no.1
EditorialAgrawal Vishwani D.20222022, vol.38, no.1
Test Technology Newsletter 20222022, vol.38, no.1
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