期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2022, vol.38, no.1 2022, vol.38, no.2 2022, vol.38, no.3 2022, vol.38, no.4 2022, vol.38, no.5 2022, vol.38, no.6

题名作者出版年年卷期
Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive?Optimization AlgorithmsArasteh Bahman; Hosseini Seyed Mohamad Javad20222022, vol.38, no.2
FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic ApplicationsYadav Dev Narayan; Thangkhiew Phrangboklang Lyngton; Datta Kamalika; Chakraborty Sandip; Sengupta Indranil; Drechsler Rolf20222022, vol.38, no.2
Test Technology NewsletterDi Carlo Stefano20222022, vol.38, no.2
Low Area FPGA Implementation of AES Architecture with EPRNG for IoT ApplicationSiva Balan N.; Murugan B. S.20222022, vol.38, no.2
Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp ModelParlar ?shak; Almali M. Nuri20222022, vol.38, no.2
EditorialAgrawal Vishwani D.20222022, vol.38, no.2
Hardware Efficient Approximate Multiplier Architecture for Image Processing ApplicationsChandaka Shravani; Narayanam Balaji20222022, vol.38, no.2
Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test ProcessHuang Huajie; Dai Junjie; Dou Long; Liu Junfu; Liu Yunpeng; Chen Taotao; Wu Tianxiang; Li Junhui20222022, vol.38, no.2
An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation SeparationCai Shuo; He Binyong; Wu Sicheng; Wang Jin; Wang Weizheng; Yu Fei20222022, vol.38, no.2



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