期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2022, vol.38, no.1 2022, vol.38, no.2 2022, vol.38, no.3 2022, vol.38, no.4 2022, vol.38, no.5 2022, vol.38, no.6

题名作者出版年年卷期
Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive?Optimization AlgorithmsArasteh Bahman; Hosseini Seyed Mohamad Javad20222022, vol.38, no.2
FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic ApplicationsYadav Dev Narayan; Thangkhiew Phrangboklang Lyngton; Datta Kamalika; Chakraborty Sandip; Sengupta Indranil; Drechsler Rolf20222022, vol.38, no.2
Test Technology NewsletterDi Carlo Stefano20222022, vol.38, no.2
Low Area FPGA Implementation of AES Architecture with EPRNG for IoT ApplicationSiva Balan N.; Murugan B. S.20222022, vol.38, no.2
Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp ModelParlar ?shak; Almali M. Nuri20222022, vol.38, no.2
EditorialAgrawal Vishwani D.20222022, vol.38, no.2
Hardware Efficient Approximate Multiplier Architecture for Image Processing ApplicationsChandaka Shravani; Narayanam Balaji20222022, vol.38, no.2
Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test ProcessHuang Huajie; Dai Junjie; Dou Long; Liu Junfu; Liu Yunpeng; Chen Taotao; Wu Tianxiang; Li Junhui20222022, vol.38, no.2
An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation SeparationCai Shuo; He Binyong; Wu Sicheng; Wang Jin; Wang Weizheng; Yu Fei20222022, vol.38, no.2



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