期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2022, vol.38, no.1 2022, vol.38, no.2 2022, vol.38, no.3 2022, vol.38, no.4 2022, vol.38, no.5 2022, vol.38, no.6

题名作者出版年年卷期
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony AlgorithmArasteh Bahman; Imanzadeh Parisa; Arasteh Keyvan; Gharehchopogh Farhad Soleimanian; Zarei Bagher20222022, vol.38, no.3
A Systematic Bit Selection Method for Robust SRAM PUFsWang Wendong; Singh Adit D.; Guin Ujjwal20222022, vol.38, no.3
The Detection of Malicious Modifications in the FPGAZahid Kamran20222022, vol.38, no.3
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage ParallelismSparkman Brett; Smith Scott C.; Di Jia20222022, vol.38, no.3
EditorialAgrawal Vishwani D.20222022, vol.38, no.3
Deep Soft Error Propagation Modeling Using Graph Attention NetworkMa Junchi; Duan Zongtao; Tang Lei20222022, vol.38, no.3
Test Technology Newsletter 20222022, vol.38, no.3
Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoostXiao Yindong; Zeng Yutong; Wu Qiong; Liu Ke; Li Yanjun; Hu Chong20222022, vol.38, no.3
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFsKroeger Trevor; Cheng Wei; Danger Jean-Luc; Guilley Sylvain; Karimi Naghmeh20222022, vol.38, no.3



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