期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2022, vol.38, no.1 2022, vol.38, no.2 2022, vol.38, no.3 2022, vol.38, no.4 2022, vol.38, no.5 2022, vol.38, no.6

题名作者出版年年卷期
Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance ApplicationRaju D. Tilak; Rao Y. Srinivasa20222022, vol.38, no.4
Temperature and Humidity Controlled Test Bench for Temperature Sensor CharacterizationAmin Syed Usman; Shahbaz Muhammad Aaquib; Jawed Syed Arsalan; Khan Fahd; Junaid Muhammad; Kaleem Danish; Siddiq Musaddiq; Warsi Zain; Naveed20222022, vol.38, no.4
EditorialAgrawal Vishwani D.20222022, vol.38, no.4
A New Approximate 4-2 Compressor using Merged Sum and CarryJyothi Chinthalgiri; Saranya K.; Jammu Bhaskara Rao; Veeramachaneni Sreehari; Mahammad SK Noor20222022, vol.38, no.4
Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point InsertionSun Yang; Millican Spencer K.20222022, vol.38, no.4
The Newsletter of the Test Technology Technical Council of the IEEE Computer Society 20222022, vol.38, no.4
Automated Design Error Debugging of Digital VLSI CircuitsMoness Mohammed; Gaber Lamya; Hussein Aziza I.; Ali Hanafy M.20222022, vol.38, no.4
Experimental and Simulation Results of Wien Bridge Oscillator Circu?t Realized w?th Op-Amp Designed Using a MemristorParlar ?shak; Almali M. Nuri20222022, vol.38, no.4
Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular AutomataDehbozorgi Leila; Sabbaghi-Nadooshan Reza; Kashaninia Alireza20222022, vol.38, no.4
CMOS Implementation and Performance Analysis of Known Approximate 4:2 CompressorsAnguraj Parthibaraj; Krishnan Thiruvenkadam; Subramanian Saravanan20222022, vol.38, no.4



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