期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal CouplingJunpeng Feng; Marvin Onabajo20142014, vol.30, no.1
Clock Faults Induced Min and Max Delay ViolationsD. Rossi; M. Omana; J. M. Cazeaux; C. Metra; T. M. Mak20142014, vol.30, no.1
Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path DelaySushmita Kadiyala Rao; Ryan Robucci; Chintan Patel20142014, vol.30, no.1
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed LaserY. Ren; A. L. He; S. T. Shi; G. Guo; L. Chen; S. J. Wen; R. Wong; N. W. van Vonno; B. L. Bhuva20142014, vol.30, no.1
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection AssessmentUjjwal Guin; Daniel DiMase; Mohammad Tehranipoor20142014, vol.30, no.1
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level CircuitsM. Favalli; M. Dalpasso20142014, vol.30, no.1
A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICsBei Zhang; Vishwani D. Agrawal20142014, vol.30, no.1
Low Power Memory Built in Self Test Address Generator Using Clock Controlled Linear Feedback Shift RegistersK. Murali Krishna; M. Sailaja20142014, vol.30, no.1
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective AccelerometersAhmed Amine Rekik; Florence Azais; Frederick Mailly; Pascal Nouet20142014, vol.30, no.1
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges AheadUjjwal Guin; Daniel DiMase; Mohammad Tehranipoor20142014, vol.30, no.1



制造业外文文献服务平台