期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
Dynamic Threshold Delay Characterization Model for Improved Static Timing AnalysisPulkit Bhatnagar; Sachin Garg20142014, vol.30, no.5
Fault Diagnosis of Analog Circuit Based on High-Order Cumulants and Information FusionTao Xie; Yigang He20142014, vol.30, no.5
Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic ParametersSen-Wen Hsiao; Xian Wang; Abhijit Chatterjee20142014, vol.30, no.5
Adaptive Bayesian Diagnosis of Intermittent FaultsLaura Rodriguez Gomez; Alejandro Cook; Thomas Indlekofer; Sybille Hellebrand; Hans-Joachim Wunderlich20142014, vol.30, no.5
Intra-Cell Defects DiagnosisZ. Sun; A. Bosio; L. Dilillo; P. Girard; S. Pravossoudovich; A. Virazel; E. Auvray20142014, vol.30, no.5
Dynamic X-filling for Peak Capture Power Reduction for Compact Test SetsStephan Eggersgluss20142014, vol.30, no.5
Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency ScalingSpencer K. Millican; Kewal K. Saluja20142014, vol.30, no.5
Testing Methods for PUF-Based Secure Key Storage CircuitsMafalda Cortez; Gijs Roelofs; Said Hamdioui; Giorgio Di Natale20142014, vol.30, no.5
A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event TransientsHoda Pahlevanzadeh; Qiaoyan Yu20142014, vol.30, no.5
On the Test and Mitigation of Malfunctions in Low-Power SRAMsL. H. Bonet Zordan; A. Bosio; L. Dilillo; P. Girard; A. Virazel; N. Badereddine20142014, vol.30, no.5
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