期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
Enhanced Low Complex Double Error Correction Coding with Crosstalk Avoidance for Reliable On-Chip Interconnection LinkM. Maheswari; G. Seetharaman20142014, vol.30, no.4
A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and SystemsD. A. Tran; A. Virazel; A. Bosio; L. Dilillo; P. Girard; S. Pravossoudovich; H. J. Wunderlich20142014, vol.30, no.4
An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation ExtractionCherifa Tahanout; Hakim Tahi; Boualem Djezzar; Abdelmadjid Benabdelmomene; Mohamed Goudjil; Becharia Nadji20142014, vol.30, no.4
Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAsAnees Ullah; Luca Sterpone20142014, vol.30, no.4
Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal ClassifiersMohamed A. El-Gamal; Abdel-Karim S. O. Hassan; Ahmad A. I. Ibrahim20142014, vol.30, no.4
The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case StudyStefan Vock; Omar Escalona; Colin Turner; Frank Owens20142014, vol.30, no.4
A Functional Approach for Testing the Reorder Buffer MemoryS. Di Carlo; M. Gaudesi; E. Sanchez; M. Sonza Reorda20142014, vol.30, no.4
Fault Detection of Linear Analog Integrated Circuit in NetworkDeliang Li; Kaoli Huang; Changlong Wang20142014, vol.30, no.4



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