期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
UntitledAgrawal, Vishwani D.20142014, vol.30, no.6
Single Event Resilient Dynamic Logic DesignsWang, H. -B.; Li, M. -L.; Chen, L.; Liu, R.; Baeg, S.; Wen, S. -J.; Wong, R.; Fung, R.; Bi, J. -S.20142014, vol.30, no.6
Access Port Protection for Reconfigurable Scan NetworksBaranowski, Rafal; Kochte, Michael A.; Wunderlich, Hans-Joachim20142014, vol.30, no.6
Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate TransformationHsieh, Tong-Yu; Peng, Yi-Han; Li, Kuan-Hsien20142014, vol.30, no.6
Characterization of a Passive Telemetric System for ISM Band Pressure SensorsPeng, Yujia; Rahman, B. M. Farid; Wang, TengXing; Wang, Guoan; Liu, Xinchuan; Wen, Xuejun20142014, vol.30, no.6
On-line Condition Monitoring and Maintenance of Power Electronic ConvertersKhan, Shakeb A.; Islam, Tariqul; Khera, Neeraj; Agarwala, A. K.20142014, vol.30, no.6
Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection ToolsZhang, Yu; Zhang, Bei; Agrawal, Vishwani D.20142014, vol.30, no.6
Efficient LFSR Reseeding Based on Internal-Response FeedbackLien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Chakrabarty, Krishnendu20142014, vol.30, no.6
Low-Cost Concurrent Error Detection for GCM and CCMGuo, Xiaofei; Karri, Ramesh20142014, vol.30, no.6
Testing Disturbance Faults in Various NAND Flash MemoriesHou, Chih-Sheng; Li, Jin-Fu20142014, vol.30, no.6
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