期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal CouplingJunpeng Feng; Marvin Onabajo20142014, vol.30, no.1
Clock Faults Induced Min and Max Delay ViolationsD. Rossi; M. Omana; J. M. Cazeaux; C. Metra; T. M. Mak20142014, vol.30, no.1
Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path DelaySushmita Kadiyala Rao; Ryan Robucci; Chintan Patel20142014, vol.30, no.1
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed LaserY. Ren; A. L. He; S. T. Shi; G. Guo; L. Chen; S. J. Wen; R. Wong; N. W. van Vonno; B. L. Bhuva20142014, vol.30, no.1
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection AssessmentUjjwal Guin; Daniel DiMase; Mohammad Tehranipoor20142014, vol.30, no.1
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level CircuitsM. Favalli; M. Dalpasso20142014, vol.30, no.1
A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICsBei Zhang; Vishwani D. Agrawal20142014, vol.30, no.1
Low Power Memory Built in Self Test Address Generator Using Clock Controlled Linear Feedback Shift RegistersK. Murali Krishna; M. Sailaja20142014, vol.30, no.1
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective AccelerometersAhmed Amine Rekik; Florence Azais; Frederick Mailly; Pascal Nouet20142014, vol.30, no.1
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges AheadUjjwal Guin; Daniel DiMase; Mohammad Tehranipoor20142014, vol.30, no.1



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