期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
An On-Chip Sensor to Monitor NBTI Effects in SRAMsA. Ceratti; T. Copetti; L. Bolzani; F. Vargas; R. Fagundes20142014, vol.30, no.2
An RTN Variation Tolerant SRAM Screening Test Design with Gaussian Mixtures Approximations of Long-Tail DistributionsWorawit Somha; Hiroyuki Yamauchi20142014, vol.30, no.2
Error Correction Schemes with Erasure Information for Fast MemoriesSamuel Evain; Valentin Savin; Valentin Gherman20142014, vol.30, no.2
Developing Inherently Resilient Software Against Soft-Errors Based on Algorithm Level Inherent FeaturesBahman Arasteh; Seyed Ghassem Miremadi; Amir Masoud Rahmani20142014, vol.30, no.2
Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent UndersamplingDebesh Bhatta; Aritra Banerjee; Sabyasachi Deyati; Nicholas Tzou; Abhijit Chatterjee20142014, vol.30, no.2
A Test Time Theorem and its ApplicationsPraveen Venkataramani; Suraj Sindia; Vishwani D. Agrawal20142014, vol.30, no.2
Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length CodingHaiying Yuan; Jiaping Mei; Hongying Song; Kun Guo20142014, vol.30, no.2
Soft Fault Diagnosis of Analog Circuits via Frequency Response Function MeasurementsYongle Xie; Xifeng Li; Sanshan Xie; Xuan Xie; Qizhong Zhou20142014, vol.30, no.2



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