期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
Verilog HDL Simulator Technology: A SurveyTze Sin Tan; Bakhtiar Affendi Rosdi20142014, vol.30, no.3
Benefits of Partitioning in a Projection-based and Realizable Model-order Reduction FlowPekka Miettinen; Mikko Honkala; Janne Roos; Martti Valtonen20142014, vol.30, no.3
Learning-oriented Property Decomposition for Automated Generation of Directed TestsMingsong Chen; Xiaoke Qin; Prabhat Mishra20142014, vol.30, no.3
GPUs Neutron Sensitivity Dependence on Data TypeP. Rech; C. Frost; L. Carro20142014, vol.30, no.3
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional TestM. de Carvalho; P. Bernardi; E. Sanchez; M. Sonza Reorda; O. Ballan20142014, vol.30, no.3
Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based TechniqueEfi Arvaniti; Yiorgos Tsiatouhas20142014, vol.30, no.3
A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVMChaolong Zhang; Yigang He; Lifen Yuan; Fangming Deng20142014, vol.30, no.3
Modeling of Physical Defects in PN Junction Based Graphene DevicesSandeep Miryala; Matheus Oleiro; Leticia Maria Bolzani Pohls; Andrea Calimera; Enrico Macii; Massimo Poncino20142014, vol.30, no.3
Research on the Efficiency Improvement of Design for Testability Using Test Point AllocationGuohua Wang; Qiang Li; Xiaomei Chen; Xiaofeng Meng20142014, vol.30, no.3
The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal CircuitsYi Ren; Li Chen20142014, vol.30, no.3



制造业外文文献服务平台