期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
Enhanced Low Complex Double Error Correction Coding with Crosstalk Avoidance for Reliable On-Chip Interconnection LinkM. Maheswari; G. Seetharaman20142014, vol.30, no.4
A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and SystemsD. A. Tran; A. Virazel; A. Bosio; L. Dilillo; P. Girard; S. Pravossoudovich; H. J. Wunderlich20142014, vol.30, no.4
An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation ExtractionCherifa Tahanout; Hakim Tahi; Boualem Djezzar; Abdelmadjid Benabdelmomene; Mohamed Goudjil; Becharia Nadji20142014, vol.30, no.4
Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAsAnees Ullah; Luca Sterpone20142014, vol.30, no.4
Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal ClassifiersMohamed A. El-Gamal; Abdel-Karim S. O. Hassan; Ahmad A. I. Ibrahim20142014, vol.30, no.4
The Use of Software Engineering Methods for Efficacious Test Program Creation: A Supportive Evidence Based Case StudyStefan Vock; Omar Escalona; Colin Turner; Frank Owens20142014, vol.30, no.4
A Functional Approach for Testing the Reorder Buffer MemoryS. Di Carlo; M. Gaudesi; E. Sanchez; M. Sonza Reorda20142014, vol.30, no.4
Fault Detection of Linear Analog Integrated Circuit in NetworkDeliang Li; Kaoli Huang; Changlong Wang20142014, vol.30, no.4



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