期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
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2018 2019 2020 2021 2022 2023
2024

2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
Dynamic Threshold Delay Characterization Model for Improved Static Timing AnalysisPulkit Bhatnagar; Sachin Garg20142014, vol.30, no.5
Fault Diagnosis of Analog Circuit Based on High-Order Cumulants and Information FusionTao Xie; Yigang He20142014, vol.30, no.5
Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic ParametersSen-Wen Hsiao; Xian Wang; Abhijit Chatterjee20142014, vol.30, no.5
Adaptive Bayesian Diagnosis of Intermittent FaultsLaura Rodriguez Gomez; Alejandro Cook; Thomas Indlekofer; Sybille Hellebrand; Hans-Joachim Wunderlich20142014, vol.30, no.5
Intra-Cell Defects DiagnosisZ. Sun; A. Bosio; L. Dilillo; P. Girard; S. Pravossoudovich; A. Virazel; E. Auvray20142014, vol.30, no.5
Dynamic X-filling for Peak Capture Power Reduction for Compact Test SetsStephan Eggersgluss20142014, vol.30, no.5
Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency ScalingSpencer K. Millican; Kewal K. Saluja20142014, vol.30, no.5
Testing Methods for PUF-Based Secure Key Storage CircuitsMafalda Cortez; Gijs Roelofs; Said Hamdioui; Giorgio Di Natale20142014, vol.30, no.5
A New Analytical Model of SET Latching Probability for Circuits Experiencing Single- or Multiple-Cycle Single-Event TransientsHoda Pahlevanzadeh; Qiaoyan Yu20142014, vol.30, no.5
On the Test and Mitigation of Malfunctions in Low-Power SRAMsL. H. Bonet Zordan; A. Bosio; L. Dilillo; P. Girard; A. Virazel; N. Badereddine20142014, vol.30, no.5
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