期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2014, vol.30, no.1 2014, vol.30, no.2 2014, vol.30, no.3 2014, vol.30, no.4 2014, vol.30, no.5 2014, vol.30, no.6

题名作者出版年年卷期
UntitledAgrawal, Vishwani D.20142014, vol.30, no.6
Single Event Resilient Dynamic Logic DesignsWang, H. -B.; Li, M. -L.; Chen, L.; Liu, R.; Baeg, S.; Wen, S. -J.; Wong, R.; Fung, R.; Bi, J. -S.20142014, vol.30, no.6
Access Port Protection for Reconfigurable Scan NetworksBaranowski, Rafal; Kochte, Michael A.; Wunderlich, Hans-Joachim20142014, vol.30, no.6
Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate TransformationHsieh, Tong-Yu; Peng, Yi-Han; Li, Kuan-Hsien20142014, vol.30, no.6
Characterization of a Passive Telemetric System for ISM Band Pressure SensorsPeng, Yujia; Rahman, B. M. Farid; Wang, TengXing; Wang, Guoan; Liu, Xinchuan; Wen, Xuejun20142014, vol.30, no.6
On-line Condition Monitoring and Maintenance of Power Electronic ConvertersKhan, Shakeb A.; Islam, Tariqul; Khera, Neeraj; Agarwala, A. K.20142014, vol.30, no.6
Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection ToolsZhang, Yu; Zhang, Bei; Agrawal, Vishwani D.20142014, vol.30, no.6
Efficient LFSR Reseeding Based on Internal-Response FeedbackLien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Chakrabarty, Krishnendu20142014, vol.30, no.6
Low-Cost Concurrent Error Detection for GCM and CCMGuo, Xiaofei; Karri, Ramesh20142014, vol.30, no.6
Testing Disturbance Faults in Various NAND Flash MemoriesHou, Chih-Sheng; Li, Jin-Fu20142014, vol.30, no.6
123



制造业外文文献服务平台