期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
General Design for Test Guidelines for RF ICQi Fan20102010, vol.26, no.1
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation PrinciplesAbhilash Goyal; Madhavan Swaminathan; Abhijit Chatterjee20102010, vol.26, no.1
Estimation of RF PA Nonlinearities after Cross-correlating Current and Output VoltagePedro Fonseca Mota; Jose A. Machado da Silva; Ricardo A. Veiga20102010, vol.26, no.1
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAsR. M. Ayadi; M. Masmoudi20102010, vol.26, no.1
ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram MethodM. A. Jalon; E. Peralias20102010, vol.26, no.1
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case StudyHsiu-Ming (Sherman) Chang; Kuan-Yu Lin; Kwang-Ting (Tim) Cheng20102010, vol.26, no.1
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal CircuitsHongjoong Shin; Joonsung Park; Jacob A. Abraham20102010, vol.26, no.1
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP LogicDavid Keezer; Carl Gray; Dany Minier; Patrice Ducharme20102010, vol.26, no.1
Using Stochastic Differential Equation for Verification of Noise in Analog/RF CircuitsRajeev Narayanan; Mohamed H. Zaki; Sofiene Tahar20102010, vol.26, no.1
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and CalibrationNorbert Dumas; Florence Azais; Frederick Mailly; Pascal Nouet20102010, vol.26, no.1
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