期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
RTL DFT Techniques to Enhance Defect Coverage for Functional Test SequencesHongxia Fang; Krishnendu Chakrabarty; Hideo Fujiwara20102010, vol.26, no.2
Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test GenerationMaheshwar Chandrasekar; Nikhil P. Rahagude; Michael S. Hsiao20102010, vol.26, no.2
Qualifying Serial Interface Jitter Rapidly and Cost-effectivelyYongquan Fan; Zeljko Zilic20102010, vol.26, no.2
Fault Table Computation on GPUsKanupriya Gulati; Sunil P. Khatri20102010, vol.26, no.2
Defining and Providing Coverage for Assertion-Based Dynamic VerificationJason G. Tong; Marc Boule; Zeljko Zilic20102010, vol.26, no.2
Analysis of Scheduled Latency Insensitive Systems with Periodic Clock CalculusBin Xue; Sandeep K. Shukla20102010, vol.26, no.2
Learning from Constraints for Formal Property CheckingIn-Ho Moon; Kevin Harer20102010, vol.26, no.2
Finding Multiple Equivalence-Preserving Transformations in Combinational Circuits through Incremental-SATGianpiero Cabodi; Leandro Dipietro; Marco Murciano; Sergio Nocco20102010, vol.26, no.2
Experience with Widening Based Equivalence Checking in Realistic Multimedia SystemsSven Verdoolaege; Martin Palkovic; Maurice Bruynooghe; Gerda Janssens; Francky Catthoor20102010, vol.26, no.2



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