期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
Fault Models for Quantum Mechanical Switching NetworksJacob D. Biamonte; Jeff S. Allen; Marek A. Perkowski20102010, vol.26, no.5
Efficient Concurrent Self-Test with Partially Specified PatternsMichael A. Kochte; Christian G. Zoellin; Hans-Joachim Wunderlich20102010, vol.26, no.5
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED CodesZhen Wang; Mark Karpovsky; Konrad J. Kulikowski20102010, vol.26, no.5
A Novel Test Point Selection Method for Analog Fault Dictionary TechniquesChengLin Yang; ShuLin Tian; Bing Long; Fang Chen20102010, vol.26, no.5
Classification of Activated Faults in the FlexRay-Based NetworksYasser Sedaghat; Seyed Ghassem Miremadi20102010, vol.26, no.5
JTAG Security System Based on CredentialsKeunyoung Park; Sang Guun Yoo; Taejun Kim; Juho Kim20102010, vol.26, no.5
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test PatternsAhmad A. Al-Yamani; Edward J. McCluskey20102010, vol.26, no.5



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