期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

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2006 2007 2008 2009 2010 2011
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2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
General Design for Test Guidelines for RF ICQi Fan20102010, vol.26, no.1
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation PrinciplesAbhilash Goyal; Madhavan Swaminathan; Abhijit Chatterjee20102010, vol.26, no.1
Estimation of RF PA Nonlinearities after Cross-correlating Current and Output VoltagePedro Fonseca Mota; Jose A. Machado da Silva; Ricardo A. Veiga20102010, vol.26, no.1
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAsR. M. Ayadi; M. Masmoudi20102010, vol.26, no.1
ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram MethodM. A. Jalon; E. Peralias20102010, vol.26, no.1
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case StudyHsiu-Ming (Sherman) Chang; Kuan-Yu Lin; Kwang-Ting (Tim) Cheng20102010, vol.26, no.1
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal CircuitsHongjoong Shin; Joonsung Park; Jacob A. Abraham20102010, vol.26, no.1
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP LogicDavid Keezer; Carl Gray; Dany Minier; Patrice Ducharme20102010, vol.26, no.1
Using Stochastic Differential Equation for Verification of Noise in Analog/RF CircuitsRajeev Narayanan; Mohamed H. Zaki; Sofiene Tahar20102010, vol.26, no.1
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and CalibrationNorbert Dumas; Florence Azais; Frederick Mailly; Pascal Nouet20102010, vol.26, no.1
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