期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication DevicesGanesh Srinivasan; Abhijit Chatterjee; Sasikumar Cherubal; Pramod Variyam20102010, vol.26, no.4
Test Generation Algorithm for Linear Systems Based on Genetic AlgorithmTing Long; Houjun Wang; Shulin Tian; Jianguo Huang; Bing Long20102010, vol.26, no.4
A BIST Solution for Frequency Domain Characterization of Analog CircuitsManuel J. Barragan; Diego Vazquez; Adoration Rueda20102010, vol.26, no.4
A New Built-in TPG Based on Berlekamp-Massey AlgorithmCleonilson Protasio de Souza; Francisco Marcos de Assis; Raimundo Carlos Silverio Freire20102010, vol.26, no.4
Bandwidth Analysis of Functional Interconnects Used as Test Access MechanismArdy van den Berg; Pengwei Ren; Erik Jan Marinissen; Georgi Gaydadjiev; Kees Goossens20102010, vol.26, no.4
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift PowerSobeeh Almukhaizim; Shouq Alsubaihi; Ozgur Sinanoglu20102010, vol.26, no.4
On the Duality of Probing and Fault AttacksBerndt M. Gammel; Stefan Mangard20102010, vol.26, no.4



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