期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
Using Evolutionary Algorithms for Signal Integrity Assessment of High-Speed Data BusesMaynard Falconer; Garrison Greenwood; Kristina Morgan; KiranKumar Kamisetty; Adam Norman; Konika Ganguly20102010, vol.26, no.3
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued LogicsStephan Eggersgluss; Gorschwin Fey; Andreas Glowatz; Friedrich Hapke; Juergen Schloeffel; Rolf Drechsler20102010, vol.26, no.3
False Error Vulnerability Study of On-line Soft Error Detection MechanismsKiran Kumar Reddy; Bharadwaj S. Amrutur; Rubin A. Parekhji20102010, vol.26, no.3
One-to-Many: Context-Oriented Code for Concurrent Error DetectionOsnat Keren20102010, vol.26, no.3
Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage DetectorsLuca Testa; Herve Lapuyade; Yann Deval; Jean-Louis Carbonero; Jean-Baptiste Begueret20102010, vol.26, no.3
Fault Modeling and Analysis for Resistive Bridging Defects in a SynchronizerHyoung-Kook Kim; Wen-Ben Jone; Laung-Terng Wang20102010, vol.26, no.3
Test Data Compression Using Multi-dimensional Pattern Run-length CodesWang-Dauh Tseng; Lung-Jen Lee20102010, vol.26, no.3



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