期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
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2018 2019 2020 2021 2022 2023
2024

2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
RTL DFT Techniques to Enhance Defect Coverage for Functional Test SequencesHongxia Fang; Krishnendu Chakrabarty; Hideo Fujiwara20102010, vol.26, no.2
Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test GenerationMaheshwar Chandrasekar; Nikhil P. Rahagude; Michael S. Hsiao20102010, vol.26, no.2
Qualifying Serial Interface Jitter Rapidly and Cost-effectivelyYongquan Fan; Zeljko Zilic20102010, vol.26, no.2
Fault Table Computation on GPUsKanupriya Gulati; Sunil P. Khatri20102010, vol.26, no.2
Defining and Providing Coverage for Assertion-Based Dynamic VerificationJason G. Tong; Marc Boule; Zeljko Zilic20102010, vol.26, no.2
Analysis of Scheduled Latency Insensitive Systems with Periodic Clock CalculusBin Xue; Sandeep K. Shukla20102010, vol.26, no.2
Learning from Constraints for Formal Property CheckingIn-Ho Moon; Kevin Harer20102010, vol.26, no.2
Finding Multiple Equivalence-Preserving Transformations in Combinational Circuits through Incremental-SATGianpiero Cabodi; Leandro Dipietro; Marco Murciano; Sergio Nocco20102010, vol.26, no.2
Experience with Widening Based Equivalence Checking in Realistic Multimedia SystemsSven Verdoolaege; Martin Palkovic; Maurice Bruynooghe; Gerda Janssens; Francky Catthoor20102010, vol.26, no.2



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