期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
Using Evolutionary Algorithms for Signal Integrity Assessment of High-Speed Data BusesMaynard Falconer; Garrison Greenwood; Kristina Morgan; KiranKumar Kamisetty; Adam Norman; Konika Ganguly20102010, vol.26, no.3
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued LogicsStephan Eggersgluss; Gorschwin Fey; Andreas Glowatz; Friedrich Hapke; Juergen Schloeffel; Rolf Drechsler20102010, vol.26, no.3
False Error Vulnerability Study of On-line Soft Error Detection MechanismsKiran Kumar Reddy; Bharadwaj S. Amrutur; Rubin A. Parekhji20102010, vol.26, no.3
One-to-Many: Context-Oriented Code for Concurrent Error DetectionOsnat Keren20102010, vol.26, no.3
Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage DetectorsLuca Testa; Herve Lapuyade; Yann Deval; Jean-Louis Carbonero; Jean-Baptiste Begueret20102010, vol.26, no.3
Fault Modeling and Analysis for Resistive Bridging Defects in a SynchronizerHyoung-Kook Kim; Wen-Ben Jone; Laung-Terng Wang20102010, vol.26, no.3
Test Data Compression Using Multi-dimensional Pattern Run-length CodesWang-Dauh Tseng; Lung-Jen Lee20102010, vol.26, no.3



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