期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

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2006 2007 2008 2009 2010 2011
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2018 2019 2020 2021 2022 2023
2024

2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication DevicesGanesh Srinivasan; Abhijit Chatterjee; Sasikumar Cherubal; Pramod Variyam20102010, vol.26, no.4
Test Generation Algorithm for Linear Systems Based on Genetic AlgorithmTing Long; Houjun Wang; Shulin Tian; Jianguo Huang; Bing Long20102010, vol.26, no.4
A BIST Solution for Frequency Domain Characterization of Analog CircuitsManuel J. Barragan; Diego Vazquez; Adoration Rueda20102010, vol.26, no.4
A New Built-in TPG Based on Berlekamp-Massey AlgorithmCleonilson Protasio de Souza; Francisco Marcos de Assis; Raimundo Carlos Silverio Freire20102010, vol.26, no.4
Bandwidth Analysis of Functional Interconnects Used as Test Access MechanismArdy van den Berg; Pengwei Ren; Erik Jan Marinissen; Georgi Gaydadjiev; Kees Goossens20102010, vol.26, no.4
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift PowerSobeeh Almukhaizim; Shouq Alsubaihi; Ozgur Sinanoglu20102010, vol.26, no.4
On the Duality of Probing and Fault AttacksBerndt M. Gammel; Stefan Mangard20102010, vol.26, no.4



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