期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2010, vol.26, no.1 2010, vol.26, no.2 2010, vol.26, no.3 2010, vol.26, no.4 2010, vol.26, no.5 2010, vol.26, no.6

题名作者出版年年卷期
Fault Models for Quantum Mechanical Switching NetworksJacob D. Biamonte; Jeff S. Allen; Marek A. Perkowski20102010, vol.26, no.5
Efficient Concurrent Self-Test with Partially Specified PatternsMichael A. Kochte; Christian G. Zoellin; Hans-Joachim Wunderlich20102010, vol.26, no.5
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED CodesZhen Wang; Mark Karpovsky; Konrad J. Kulikowski20102010, vol.26, no.5
A Novel Test Point Selection Method for Analog Fault Dictionary TechniquesChengLin Yang; ShuLin Tian; Bing Long; Fang Chen20102010, vol.26, no.5
Classification of Activated Faults in the FlexRay-Based NetworksYasser Sedaghat; Seyed Ghassem Miremadi20102010, vol.26, no.5
JTAG Security System Based on CredentialsKeunyoung Park; Sang Guun Yoo; Taejun Kim; Juho Kim20102010, vol.26, no.5
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test PatternsAhmad A. Al-Yamani; Edward J. McCluskey20102010, vol.26, no.5



制造业外文文献服务平台